High-Efficiency and High-Reliability Deep-UV Light-Emitting Diodes Using Transparent Ni-Implanted AlN Ohmic Electrodes.
Tae Hoon ParkKyung Rock SonHideki HirayamaTae Geun KimPublished in: IEEE Access (2021)
Keyphrases
- high efficiency
- high reliability
- light emitting diodes
- light emitting
- low cost
- high precision
- low overhead
- video camera
- high accuracy
- electric field
- memory space
- real and synthetic datasets
- high density
- arbitrary shape
- learning resources
- density based clustering
- result quality
- real time
- e learning
- model selection
- high speed
- spatio temporal
- computer conferencing
- light intensity
- moving objects