RESULT QUALITY
Experts
- Ke-Horng Chen
- Kang-Yoon Lee
- Anastasia Ailamaki
- Anna Sasak-Okon
- Luc Bouganim
- Goetz Graefe
- Evangelos Kanoulas
- Wentao Wu
- Patrick Valduriez
- Thomas Heinis
- Marek Tudruj
- José M. Burdio
- Tsung-Yen Tsai
- Oscar Lucía
- Jeffrey F. Naughton
- Keum-Cheol Hwang
- Harumi A. Kuno
- Xiu Yin Zhang
- Jiann-Jong Chen
- Yuh-Shyan Hwang
- Ying-Hsi Lin
- Shian-Ru Lin
- Pawel Gawrychowski
- Shay Mozes
- Yuanyuan Zhu
- Quan Xue
- Sang-Kyoo Han
- Hector Sarnago
- Yvon Savaria
- Hakan Hacigümüs
- Janet L. Wiener
- Oren Weimann
- Ramesh K. Pokharel
- Youngoo Yang
- Thiago Batista Soeiro
- Volker Markl
- Maarten de Rijke
- Bong-Hwan Kwon
- Gun-Woo Moon
Venues
- CoRR
- IEEE Trans. Ind. Electron.
- IEEE Access
- IECON
- ISCAS
- Sensors
- SIGIR
- IEEE Trans. Circuits Syst. I Regul. Pap.
- IEEE J. Solid State Circuits
- IEEE Trans. Circuits Syst. II Express Briefs
- IEICE Electron. Express
- IEICE Trans. Electron.
- SIGMOD Conference
- ICDE
- Microelectron. J.
- ICECS
- MWSCAS
- OFC
- ISOCC
- IAS
- CIKM
- Quantum Inf. Process.
- IEEE Trans. Instrum. Meas.
- VLDB
- IEEE Trans. Very Large Scale Integr. Syst.
- Proc. VLDB Endow.
- ESSCIRC
- AAAI
- WWW (Companion Volume)
- ISSCC
- DaMoN
- CIDR
- IEEE Trans. Veh. Technol.
- ICASSP
- Proc. IEEE
- J. Chem. Inf. Comput. Sci.
- Inf. Process. Manag.
- ICCD
- J. Circuits Syst. Comput.
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