RESULT QUALITY
Experts
- Ke-Horng Chen
- Kang-Yoon Lee
- Anastasia Ailamaki
- Anna Sasak-Okon
- Wentao Wu
- Goetz Graefe
- Patrick Valduriez
- Luc Bouganim
- Evangelos Kanoulas
- Youngoo Yang
- Yuh-Shyan Hwang
- Jeffrey F. Naughton
- Shay Mozes
- Ramesh K. Pokharel
- Hector Sarnago
- Oren Weimann
- Sang-Kyoo Han
- Hakan Hacigümüs
- Marek Tudruj
- José M. Burdio
- Keum-Cheol Hwang
- Volker Markl
- Tsung-Yen Tsai
- Harumi A. Kuno
- Quan Xue
- Gun-Woo Moon
- Pawel Gawrychowski
- Thomas Heinis
- Bong-Hwan Kwon
- Yuanyuan Zhu
- Jiann-Jong Chen
- Maarten de Rijke
- Shian-Ru Lin
- Xiu Yin Zhang
- Thiago Batista Soeiro
- Ying-Hsi Lin
- Yvon Savaria
- Oscar Lucía
- Janet L. Wiener
Venues
- CoRR
- IEEE Trans. Ind. Electron.
- IEEE Access
- IECON
- ISCAS
- Sensors
- IEEE Trans. Circuits Syst. II Express Briefs
- IEEE J. Solid State Circuits
- SIGIR
- IEEE Trans. Circuits Syst. I Regul. Pap.
- IEICE Electron. Express
- IEICE Trans. Electron.
- ICDE
- SIGMOD Conference
- OFC
- ICECS
- Microelectron. J.
- MWSCAS
- IAS
- ISOCC
- WWW (Companion Volume)
- IEEE Trans. Instrum. Meas.
- VLDB
- CIKM
- Quantum Inf. Process.
- AAAI
- CIDR
- DaMoN
- Proc. VLDB Endow.
- IEEE Trans. Very Large Scale Integr. Syst.
- ISSCC
- ESSCIRC
- Int. J. Autom. Technol.
- Inf. Process. Lett.
- Inf. Process. Manag.
- Concurr. Comput. Pract. Exp.
- ICCD
- ICIRA (2)
- ICASSP
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend