DENSITY BASED CLUSTERING
Experts
- Jörg Sander
- Hans-Peter Kriegel
- Arthur Zimek
- Ricardo J. G. B. Campello
- Ke-Horng Chen
- Claudia Plant
- Jian Hou
- Dhabaleswar K. Panda
- Christian Böhm
- Xiaofei Xu
- Leman Akoglu
- Martin Pfeifle
- Zengyou He
- Shengchun Deng
- Xu E
- Fabrizio Angiulli
- Thomas Seidl
- Philip S. Yu
- Hiroyuki Kitagawa
- M. Narasimha Murty
- Sanjay Chawla
- Charu C. Aggarwal
- Ira Assent
- Son T. Mai
- Christian S. Jensen
- Aoying Zhou
- Erich Schubert
- Fan Yang
- Sanghamitra Bandyopadhyay
- Noha A. Yousri
- Sang-Kyoo Han
- Xiao Qin
- Kang-Yoon Lee
- Jiawei Han
- Jian Zhou
- Tao Li
- Peer Kröger
- Mohamed Abid
- Martin Ester
Venues
- CoRR
- IEEE Access
- IEEE Trans. Ind. Electron.
- Sensors
- ISCAS
- Pattern Recognit.
- Inf. Sci.
- IECON
- IEEE Trans. Circuits Syst. II Express Briefs
- ICDM
- Expert Syst. Appl.
- IEEE Trans. Circuits Syst. I Regul. Pap.
- J. Comput. Chem.
- Pattern Recognit. Lett.
- Knowl. Based Syst.
- IEEE Trans. Knowl. Data Eng.
- CLUSTER
- ICDE
- IEICE Electron. Express
- IEEE J. Solid State Circuits
- KDD
- CIKM
- CCGRID
- Bioinform.
- OFC
- IEICE Trans. Electron.
- SDM
- Neurocomputing
- IJCNN
- J. Intell. Fuzzy Syst.
- SIGMOD Conference
- Clust. Comput.
- AAAI
- ICECS
- Microelectron. J.
- IEEE BigData
- 计算机科学
- PAKDD
- ICDM Workshops
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