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An improved hierarchical test generation technique for combinational circuits with repetitive sub-circuits.
Dhruva R. Chakrabarti
Ajai Jain
Published in:
Asian Test Symposium (1995)
Keyphrases
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test generation
logic circuits
circuit design
high speed
delay insensitive
test cases
asynchronous circuits
design automation
test sequences
analog circuits
image processing
case study
high quality
information technology
data sets
information systems
computer vision
artificial intelligence
databases