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Random Pattern Testability of the Open Defect Detection Method using Application of Time-variable Electric Field.
Hiroyuki Yotsuyanagi
Masaki Hashizume
Taisuke Iwakiri
Masahiro Ichimiya
Takeomi Tamesada
Published in:
DELTA (2002)
Keyphrases
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detection method
electric field
detection algorithm
face detection
feature detection
face recognition
detection rate
region detection