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Concurrency-oriented SoC re-certification by reusing block-level test vectors.

Hsuan-Ming ChouHong-Chang WuYi-Chiao ChenShih-Chieh Chang
Published in: ISQED (2014)
Keyphrases
  • databases
  • learning objects
  • statistical tests
  • database systems
  • feature vectors
  • low cost
  • data management
  • fine grained
  • test data
  • third party
  • principal components
  • concurrency control
  • data flow