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inductive power transfer for non-contact wafer-level testing.

Andrzej RadeckiHayun ChungYoichi YoshidaNoriyuki MiuraTsunaaki ShideiHiroki IshikuroTadahiro Kuroda
Published in: ISSCC (2011)
Keyphrases
  • machine learning
  • power consumption
  • levels of abstraction
  • real time
  • higher level
  • multi agent systems
  • evolutionary algorithm
  • test cases
  • knowledge transfer
  • computational power
  • power distribution