Opart: A hardware-description language for test generation.
József SzirayZsolt NagyPublished in: Microprocessing and Microprogramming (1991)
Keyphrases
- test generation
- hardware description language
- integrated circuit
- hardware design
- programmable logic
- test cases
- design automation
- hardware designs
- symbolic execution
- test sequences
- field programmable gate array
- static analysis
- quality assurance
- general purpose
- software testing
- test data generation
- artificial intelligence
- xml documents
- database systems
- information systems
- computer vision