Tackling Test Challenges for Interposer-Based 2.5-D Integrated Circuits.

Ran Wang Krishnendu Chakrabarty

Published in: IEEE Des. Test (2017)

Keyphrases

integrated circuit
built in self test
electron beam
lessons learned
real world
application scenarios
test cases
data sets
databases
database systems
multiscale
image analysis
signal processing
smart card
key issues