An efficient test vector generation for checking analog/mixed-signal functional models.

ByongChan Lim Jaeha Kim Mark A. Horowitz

Published in: DAC (2010)

Keyphrases

mixed signal
low power
multi channel
vlsi circuits
power consumption
digital circuits
cmos technology
low cost
high speed
test cases
feature vectors
hidden markov models
high resolution
model based diagnosis
image sensor
circuit design
single chip
video sequences
computer vision