Guest editorial [Special section on innovations in VLSI automatic test equipment (ATEs)].

Sunil R. Das Rochit Rajsuman

Published in: IEEE Trans. Instrum. Meas. (2003)

Keyphrases

special section
special issue
semi automatic
fully automatic
award winning
vlsi design
signal processing
search algorithm
high speed
data driven
test cases
databases
knowledge base
medical images