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A novel critical path heuristic for fast fault grading.

Michele FavalliPiero OlivoBruno Riccò
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1991)
Keyphrases
  • critical path
  • job shop scheduling problem
  • fault diagnosis
  • genetic algorithm
  • fault detection
  • special case
  • fuzzy logic
  • simulated annealing
  • heuristic search
  • automatic assessment