Login / Signup
Reversible dielectric breakdown in ultrathin Hf based high-k stacks under current-limited stresses.
Albert Crespo-Yepes
Javier Martín-Martínez
Rosana Rodríguez
Montserrat Nafría
Xavier Aymerich
Published in:
Microelectron. Reliab. (2009)
Keyphrases
</>
leakage current
low voltage
electrical properties
gate insulator
wide range
high frequency
high precision
database
information systems
feature vectors
search engine
feature extraction
markov chain
low frequency
small size