Aging-aware Adaptive Voltage Scaling in 22nm high-K/metal-gate tri-gate CMOS.
Minki ChoCarlos TokunagaMuhammad M. KhellahJames W. TschanzVivek DePublished in: CICC (2015)
Keyphrases
- cmos technology
- low voltage
- field effect transistors
- leakage current
- nm technology
- low power
- power consumption
- metal oxide semiconductor
- steady state
- high density
- parallel processing
- gate dielectrics
- silicon dioxide
- power dissipation
- wide range
- high speed
- power supply
- low cost
- neural network
- nano scale
- multiple input
- mathematical analysis
- design considerations
- integrated circuit
- high precision
- silicon on insulator
- real time