A Deep Learning Approach to Powder X-Ray Diffraction Pattern Analysis: Addressing Generalizability and Perturbation Issues Simultaneously.
Byung Do LeeJin-Woong LeeJunuk AhnSeonghwan KimWoon Bae ParkKee-Sun SohnPublished in: Adv. Intell. Syst. (2023)
Keyphrases
- x ray
- pattern analysis
- deep learning
- pattern recognition
- x ray images
- three dimensional
- digital x ray images
- intraoperative
- unsupervised learning
- computational intelligence
- image analysis
- pattern classification
- machine learning
- transmission electron microscopy
- tomographic images
- weakly supervised
- electron microscopy
- data analysis
- mental models
- model selection
- multi view
- supervised learning
- object recognition
- image processing
- artificial intelligence
- metal oxide
- neural network