Burn-in and thermal cyclic tests to determine the short-term reliability of a thin film resistance temperature detector.
Julian W. PostA. BhattacharyyaPublished in: Microelectron. Reliab. (2012)
Keyphrases
- short term
- thin film
- room temperature
- long term
- short term and long term
- chemical vapor deposition
- film thickness
- high density
- short circuit
- thermal conductivity
- long term memory
- wind speed
- thermal imaging
- stock market
- high temperature
- load forecasting
- multi layer
- short and long term
- solar cell
- motion prediction
- medium term
- forecasting model
- heat transfer
- electrical properties
- infrared