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Longest-path selection for delay test under process variation.

Xiang LuZhuo LiWangqi QiuD. M. H. WalkerWeiping Shi
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2005)
Keyphrases
  • information retrieval
  • process model
  • databases
  • learning algorithm
  • computer vision
  • clustering algorithm
  • three dimensional
  • special case
  • test cases
  • test data