Sign in

Two Pattern Timing Tests Capturing Defect-Induced Multi-Gate Delay Impact of Shorts.

Sujay PandeyZhiwei LiaoShreyas NandiSuriyaprakash NatarajanArani SinhaAdit D. SinghAbhijit Chatterjee
Published in: VTS (2021)
Keyphrases
  • pattern matching
  • response time
  • neural network
  • website
  • multiscale
  • sufficient conditions
  • pattern discovery
  • user perceived