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Electron Beam Tester Integrated into a VLSI Tester.

Hironobu NiijimaYasuo TokunagaShouichi KoshizukaKazuo YakuwaPéter FazekasMathias SturmHans-Peter Feuerbaum
Published in: ITC (1988)
Keyphrases
  • electron beam
  • black box
  • test cases
  • x ray
  • integrated circuit
  • design parameters
  • optimal solution
  • three dimensional
  • search algorithm
  • high speed