Hironobu Niijima

Publication Activity (10 Years)

Years Active: 1988-1996
Publications (10 Years): 0

Publications

Yasuji Oyama, Toshinobu Kanai, Hironobu Niijima
Scan Design Oriented Test Technique for VLSI's Using ATE. ITC (1996)
Kent Kwang, Hsin Wang, Arthur Hu, Mitsuyuki Asaki, Hironobu Niijima
CAD-Driven High-Precision E-Beam Positioning. ITC (1993)
Arthur Hu, Hironobu Niijima
New approach to integrate LSI design databases with e-beam tester. ITC (1990)
Hironobu Niijima, Yasuo Tokunaga, Shouichi Koshizuka, Kazuo Yakuwa, Péter Fazekas, Mathias Sturm, Hans-Peter Feuerbaum
Electron Beam Tester Integrated into a VLSI Tester. ITC (1988)