Scan Design Oriented Test Technique for VLSI's Using ATE.

Yasuji Oyama Toshinobu Kanai Hironobu Niijima

Published in: ITC (1996)

Keyphrases

case study
engineering design
single chip
multiscale
experimental design
design decisions
test cases
design space
optimal design
design tools
design methodology
test data
real time
design process
building blocks
low cost
software engineering
evolutionary algorithm
image processing