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March SS: A Test for All Static Simple RAM Faults.

Said HamdiouiAd J. van de GoorMike Rodgers
Published in: MTDT (2002)
Keyphrases
  • test cases
  • fault diagnosis
  • fault detection
  • information retrieval
  • decision trees
  • highly reliable
  • machine learning
  • information systems
  • bayesian networks
  • data structure
  • search algorithm
  • multiresolution
  • root cause