Test response compression and bitmap encoding for embedded memories in manufacturing process monitoring.
John T. ChenJitendra KhareKen WalkerSaghir A. ShaikhJanusz RajskiWojciech MalyPublished in: ITC (2001)
Keyphrases
- run length encoding
- image compression
- bit wise
- embedded systems
- watermarking algorithm
- complexity reduction
- arithmetic coding
- variable length
- compression scheme
- manufacturing systems
- compression ratio
- quality control
- neural network
- compressed data
- manufacturing processes
- manufacturing industry
- embedded image
- block coding
- compression algorithm
- efficient compression
- multiscale