Frequency-Directed Run-Length (FDR) Codes with Application to System-on-a-Chip Test Data Compression.

Anshuman Chandra Krishnendu Chakrabarty

Published in: VTS (2001)

Keyphrases

test data
run length
test cases
training data
test set
run length encoding
machine learning
image compression
image processing
similarity measure
training set
image quality
gray level
compression scheme
compression rate