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On variable clock methods for path delay testing of sequential circuits.
Tapan J. Chakraborty
Vishwani D. Agrawal
Michael L. Bushnell
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1997)
Keyphrases
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preprocessing
empirical studies
machine learning methods
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significant improvement
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statistical tests
computer vision
image processing
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benchmark datasets
power consumption