Reduced-Code Techniques for On-Chip Static Linearity Test of SAR ADCs.

Renato S. Feitoza Manuel J. Barragan Salvador Mir

Published in: VLSI-SoC (2019)

Keyphrases

high speed
low cost
source code
test cases
test data
synthetic aperture radar
real time
image reconstruction
sar images
multiresolution
markov random field
statistical significance
dynamic analysis
programmable logic