Modeling and testing of interference faults in the nano NAND Flash memory.
Jin ZhaXiaole CuiChung-Len LeePublished in: DATE (2012)
Keyphrases
- flash memory
- garbage collection
- solid state
- file system
- embedded systems
- random access
- buffer management
- disk drives
- main memory
- test cases
- storage devices
- b tree
- database systems
- data storage
- real time
- storage management
- small size
- hand held devices
- data sets
- memory management
- fault diagnosis
- management system
- nano scale