Soft-Error Tolerance by Guard-Gate Structures on Flip-Flops in 22 and 65 nm FD-SOI Technologies.
Ryuichi NakajimaTakafumi ItoShotaro SugitaniTomoya KiiMitsunori EbaraJun FurutaKazutoshi KobayashiMathieu LouvatFrancois JacquetJean-Christophe EloyOlivier MontfortLionel JureVincent HuardPublished in: IEICE Trans. Electron. (2024)