Login / Signup
On computing the sizes of detected delay faults.
Vijay S. Iyengar
Barry K. Rosen
John A. Waicukauski
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1990)
Keyphrases
</>
neural network
data structure
test cases
fault diagnosis
model based diagnosis
fault detection
database systems
optimal solution
evolutionary algorithm
response time
error correction
critical path