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Scan Chain Ordering to Reduce Test Data for BIST-Aided Scan Test Using Compatible Scan Flip-Flops.

Hiroyuki YotsuyanagiMasayuki YamamotoMasaki Hashizume
Published in: IEICE Trans. Inf. Syst. (2010)
Keyphrases
  • test data
  • test cases
  • training data
  • high dimensional
  • machine learning
  • test set
  • decision trees
  • training set
  • high speed
  • simulated annealing
  • test suite
  • training and test data