FAE: Autoencoder-Based Failure Binning of RTL Designs for Verification and Debugging.
Cheng-Hsien ShenAaron C.-W. LiangCharles C.-H. HsuCharles H.-P. WenPublished in: ITC (2019)
Keyphrases
- model based diagnosis
- hardware designs
- model checking
- hardware description language
- web services
- failure rate
- learning algorithm
- failure detection
- fault localization
- highly reliable
- formal methods
- face verification
- design space
- formal verification
- integrated circuit
- person identification
- probabilistic model
- asynchronous circuits
- programmable logic
- bayesian networks
- execution traces
- programs written
- artificial intelligence
- real time
- functional verification