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A Physics-Based Variability-Aware Methodology to Estimate Critical Charge for Near-Threshold Voltage Latches.

Chaudhry Indra KumarIshant BhatiaArvind Kumar SharmaDeep SehgalH. S. JatanaAnand Bulusu
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2019)
Keyphrases
  • medical images
  • accurate estimation
  • deformable models
  • power system
  • neural network
  • low cost
  • transmission line
  • high voltage
  • software engineering
  • image formation
  • thresholding method
  • metal oxide