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Don't-Care Identification on Specific Bits of Test Patterns.

Kohei MiyaseSeiji KajiharaIrith PomeranzSudhakar M. Reddy
Published in: ICCD (2002)
Keyphrases
  • specific features
  • domain specific
  • long term
  • databases
  • high level
  • expert systems
  • higher level
  • pattern matching
  • test data