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Acceleration Techniques of Multiple Fault Test Generation Using Vector Pair Analysis.
Seiji Kajihara
Rikiya Nishigaya
Tetsuji Sumioka
Kozo Kinoshita
Published in:
IEICE Trans. Inf. Syst. (1995)
Keyphrases
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test generation
static analysis
pairwise
real world
image processing
object oriented
test cases