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A Novel Low-overhead Delay Testing Technique for Arbitrary Two-Pattern Test Application.

Swarup BhuniaHamid Mahmoodi-MeimandArijit RaychowdhuryKaushik Roy
Published in: DATE (2005)
Keyphrases
  • low overhead
  • test cases
  • test data
  • test generation
  • data sets
  • principal component analysis
  • load balancing
  • software testing