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Special issue on Machine Vision.
Melvyn L. Smith
Lyndon N. Smith
Published in:
Comput. Ind. (2005)
Keyphrases
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special issue
machine vision
image processing
ai edam
international journal
vision system
quality control
character recognition
applied intelligence
ecml pkdd
special section
imaging systems
computer vision
surface inspection
artificial neural networks
automated visual inspection
machine learning