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Analytical test of 3D integrated circuits.
Raphael Robertazzi
Micheal Scheurman
Matt Wordeman
Shurong Tian
Christy Tyberg
Published in:
ITC (2017)
Keyphrases
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integrated circuit
built in self test
machine learning
information systems
test data
statistical tests
electron beam
neural network
genetic algorithm
artificial intelligence
statistical significance
software testing