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Fault coverage estimation by test vector sampling.

Keerthi HeraguVishwani D. AgrawalMichael L. Bushnell
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1995)
Keyphrases
  • feature vectors
  • artificial intelligence
  • estimation process
  • genetic algorithm
  • similarity measure
  • test data
  • vector space
  • estimation algorithm
  • maximum likelihood estimation
  • accurate estimation