Studies on Bayes classifier for condition monitoring of single point carbide tipped tool based on statistical and histogram features.
M. ElangovanK. I. RamachandranV. SugumaranPublished in: Expert Syst. Appl. (2010)
Keyphrases
- bayes classifier
- single point
- condition monitoring
- feature selection
- decision trees
- support vector machine
- image features
- maximum likelihood
- naive bayes
- fault diagnosis
- tool wear
- computer vision
- naive bayes classifier
- incomplete data
- probability density function
- light source
- statistical analysis
- prior knowledge
- feature space
- training data
- feature extraction
- image processing