Compact Modeling to Device- and Circuit-Level Evaluation of Flexible TMD Field-Effect Transistors.
Morteza GholipourYing-Yu ChenDeming ChenPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2018)
Keyphrases
- field effect transistors
- semiconductor devices
- high density
- steady state
- schottky barrier
- mathematical analysis
- electron beam
- evaluation method
- evaluation methods
- high speed
- lightweight
- data sets
- evaluation process
- modeling language
- analog circuits
- circuit design
- levels of abstraction
- evaluation model
- evaluation measures
- higher level
- low cost
- dynamic programming
- mobile devices
- search algorithm
- reinforcement learning