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Single-ended SRAM with high test coverage and short test time.
Chua-Chin Wang
Chi-Feng Wu
Rain-Ted Hwang
Chia-Hsiung Kao
Published in:
IEEE J. Solid State Circuits (2000)
Keyphrases
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neural network
statistical tests
databases
wide range
data sets
knowledge base
test cases
machine learning
computer vision
power consumption