A Comprehensive Evaluation of Integrated Circuits Side-Channel Resilience Utilizing Three-Independent-Gate Silicon Nanowire Field Effect Transistors-Based Current Mode Logic.
Yanjiang LiuJiaji HeHaocheng MaTongzhou QuZibin DaiPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2022)
Keyphrases
- field effect transistors
- comprehensive evaluation
- integrated circuit
- high density
- steady state
- chip design
- schottky barrier
- semiconductor devices
- mathematical analysis
- systematic evaluation
- metal oxide semiconductor
- logic programming
- optimal solution
- fault tolerance
- missing data
- signal processing
- built in self test
- dynamic programming