High Efficiency and Low Overkill Testing for Probabilistic Circuits.

Ming-Ting Lee Chen-Hung Wu Shi-Tang Liu Cheng-Yun Hsieh James Chien-Mo Li

Published in: ITC-Asia (2020)

Keyphrases

high efficiency
high accuracy
real and synthetic datasets
uncertain data
probabilistic model
memory space
data driven
high levels
bayesian networks
test cases
high speed
probabilistic reasoning
generative model
density based clustering
delay insensitive
data sets
probabilistic approaches