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Combined Symbol Error Correction and Spare Through-Silicon Vias for 3D Memories.
Francisco Garcia-Herrero
Alfonso Sánchez-Macián
Juan Antonio Maestro
Published in:
IEEE Trans. Emerg. Top. Comput. (2021)
Keyphrases
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error correction
error correcting
high density
error detection
magnetic tape
low cost
error analysis
data hiding
channel coding
error control
ldpc codes
error detection and correction
integrated circuit
image compression
watermarking scheme
barcode