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Test data compression for digital circuits using tetrad state skip scheme.
Lokesh Sivanandam
Oorkavalan Umamaheswari
Sakthivel Periyasamy
Published in:
Des. Autom. Embed. Syst. (2017)
Keyphrases
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test data
digital circuits
test cases
test set
training data
finite state machines
state space
image compression
active learning
training set
software development
relational databases
constraint programming
data compression
data sets
testing process
functional decomposition