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Defect-controlled Resistance Degradation of Sputtered Lead Zirconate Titanate Thin Films.

Kuan-Ting HoDaniel Monteiro Diniz ReisKarla Hiller
Published in: IRPS (2022)
Keyphrases
  • thin film
  • short circuit
  • grain size
  • multi layer
  • high density
  • defect detection
  • solar cell
  • databases
  • machine learning
  • film thickness
  • viewpoint
  • multi view
  • white light interferometry