Achieving Last-Mile Functional Coverage in Testing Chip Design Software Implementations.
Ming YanJunjie ChenHangyu MaoJiajun JiangJianye HaoXingjian LiZhao TianZhichao ChenDong LiZhangkong XianYanwei GuoWulong LiuBin WangYuefeng SunYongshun CuiPublished in: ICSE-SEIP (2023)