Achieving Last-Mile Functional Coverage in Testing Chip Design Software Implementations.

Ming Yan Junjie Chen Hangyu Mao Jiajun Jiang Jianye Hao Xingjian Li Zhao Tian Zhichao Chen Dong Li Zhangkong Xian Yanwei Guo Wulong Liu Bin Wang Yuefeng Sun Yongshun Cui

Published in: ICSE-SEIP (2023)

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