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Test pattern generation system for delay faults using a high speed simulation processor 'SP'.

Yukiko IzutaFumiyasu Hirose
Published in: VTS (1992)
Keyphrases
  • high speed
  • real time
  • low power
  • high speed networks
  • fault detection
  • test cases
  • simulation model
  • expert systems
  • mathematical model
  • steady state
  • frame rate
  • simulation environment
  • error detection