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Few-shot defect detection using feature enhancement and image generation for manufacturing quality inspection.
Yu Gong
Mingzhou Liu
Xiaoqiao Wang
Conghu Liu
Jing Hu
Published in:
Appl. Intell. (2024)
Keyphrases
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defect detection
image generation
automated visual inspection
quality control
feature extraction
high resolution
feature vectors
image enhancement
high quality
digital imaging
computer vision
image processing
image quality
visual features
machine vision