Determining the test sources/sinks for NoC TAMs.

Alexandre M. Amory Edson I. Moreno Fernando Moraes Marcelo Lubaszewski

Published in: ISVLSI (2013)

Keyphrases

databases
information sources
data sources
data sets
machine learning
information retrieval
sensor networks
test suite
database
real world
metadata
decision trees
statistical tests
multiple sources
network on chip